Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy Flip-Flop Measured by Shift-Register-Based Monitor Structures. - Chikara Hamanaka; Ryosuke Yamamoto; Jun Furuta; Kanto Kubota; Kazutoshi Kobayashi; Hidetoshi Onodera (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2011)