A Hybrid Modelling Approach for Parameter Estimation of Analytical Reflection Models in the Failure Analysis Process of Semiconductors. - Simon Kamm; Kanuj Sharma; Nasser Jazdi; Michael Weyrich (CASE, 2021)

Non-Destructive Failure Analysis of Power Devices via Time- Domain Reflectometry. - Kanuj Sharma; Simon Kamm; Valentyna Afanasenko; Kevin Muñoz Barón; Ingmar Kallfass (CASE, 2021)

Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors. - Simon Kamm; Sandra Bickelhaupt; Kanuj Sharma; Nasser Jazdi; Ingmar Kallfass; Michael Weyrich (ETFA, 2022)