Effects of electromagnetic near-field stress on SiGe HBT's reliability. - Ali Alaeddine; Moncef Kadi; Kaouther Daoud; B. Mazari (Microelectron. Reliab., 2009)

Characteristics degradation of the SiGe HBT under electromagnetic field stress. - Ali Alaeddine; Moncef Kadi; Kaouther Daoud; B. Beydoun (Microelectron. Reliab., 2010)