Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. - Satyam Kumar 003; Tarun Samadder; Karansingh Thakor; Uma Sharma; Souvik Mahapatra (IRPS, 2021)

A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake. - Tarun Samadder; Satyam Kumar 003; Karansingh Thakor; Souvik Mahapatra (IRPS, 2021)

Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs. - Himanshu Diwakar; Karansingh Thakor; Souvik Mahapatra (IRPS, 2022)

Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories. - Karansingh Thakor; Nikhil Rangarajan; Himanshu Diwakar; Rashmi Saikia; Tarun Samadder; Souvik Mahapatra; Shyam Raghunathan; Yingda Dong (IMW, 2024)

A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions. - Karansingh Thakor; Payel Chatterjee; Souvik Mahapatra (IRPS, 2024)

TCAD Based Isolation of Self-Heat Enhanced HCD and NBTI in GAA SNS p-FET. - Karansingh Thakor; Rai Sambhav; Rashmi Saikia; Souvik Mahapatra (IRPS, 2025)