Impact of Soft Error Challenge on SoC Design. - Yervant Zorian; Valery A. Vardanian; K. Aleksanyan; K. Amirkhanyan (IOLTS, 2005)

Application of defect injection flow for fault validation in memories. - K. Amirkhanyan; A. Davtyan; Gurgen Harutyunyan; T. Melkumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

On a Method for Segmentation of Memory Instances with Row Redundancies. - Karen Amirkhanyan; Valery A. Vardanian (EWDTS, 2019)

An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. - Mahta Mayahinia; Mehdi B. Tahoori; Gurgen Harutyunyan; Grigor Tshagharyan; Karen Amirkhanyan (ITC, 2022)

An Approach for Increasing Memory Repair Efficiency. - Karen Amirkhanyan; A. Babayan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2024)

Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs. - Karen Amirkhanyan; Valery A. Vardanian; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2024)

Testing for Electromigration in Sub-5-nm FinFET Memories. - Mahta Mayahinia; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Karen Amirkhanyan; Artur Ghukasyan; Gurgen Harutyunyan; Yervant Zorian (IEEE Des. Test, 2024)