Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method. - Hasan Ymeri; Bart Nauwelaers; Karen Maex (Integr., 2000)

On the two-dimensional capacitance calculation of multiconductor multilayered interconnects. - Hasan Ymeri; Bart Nauwelaers; Karen Maex (Ann. des Télécommunications, 2001)

Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate. - Hasan Ymeri; Bart Nauwelaers; Karen Maex (Integr., 2001)

Simple and Efficient Approach for Shunt Admittance Parameters Calculations of VLSI On-Chip Interconnects on Semiconducting Substrate. - Hasan Ymeri; Bart Nauwelaers; Karen Maex; David De Roest; Michele Stucchi; Servaas Vandenberghe (DATE, 2002)

Interconnect exploration for future wire dominated technologies. - Antonis Papanikolaou; Miguel Miranda; Francky Catthoor; Henk Corporaal; Hugo De Man; David De Roest; Michele Stucchi; Karen Maex (SLIP, 2002)

A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate. - Hasan Ymeri; Bart Nauwelaers; Karen Maex; Servaas Vandenberghe; David De Roest (Microprocess. Microsystems, 2002)

Frequency dependence in interline capacitance measurements. - Michele Stucchi; Karen Maex (IEEE Trans. Instrum. Meas., 2002)

Global interconnect trade-off for technology over memory modules to application level: case study. - Antonis Papanikolaou; Miguel Miranda; Francky Catthoor; Henk Corporaal; Hugo De Man; David De Roest; Michele Stucchi; Karen Maex (SLIP, 2003)

How Can System-Level Design Solve the Interconnect Technology Scaling Problem? - Francky Catthoor; Andrea Cuomo; Grant Martin; Patrick Groeneveld; Rudy Lauwereins; Karen Maex; Patrick van de Steeg; Ron Wilson (DATE, 2004)

Interconnect width selection for deep submicron designs using the table lookup method. - Mandeep Bamal; Evelyn Grossar; Michele Stucchi; Karen Maex (SLIP, 2004)

Analog and Digital Circuit Design in 65 nm CMOS: End of the Road? - Georges G. E. Gielen; Wim Dehaene; Phillip Christie; Dieter Draxelmayr; Edmond Janssens; Karen Maex; Ted Vucurevich (DATE, 2005)

Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules. - Hua Wang; Miguel Miranda; Wim Dehaene; Francky Catthoor; Karen Maex (DATE, 2005)

Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. - Yunlong Li; Zsolt Tökei; Philippe Roussel; Guido Groeseneken; Karen Maex (Microelectron. Reliab., 2005)

A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. - Kris Vanstreels; Marc D'Olieslaeger; Ward De Ceuninck; Jan D'Haen; Karen Maex (Microelectron. Reliab., 2005)

Statistically Aware SRAM Memory Array Design. - Evelyn Grossar; Michele Stucchi; Karen Maex; Wim Dehaene (ISQED, 2006)

Impact of interconnect resistance increase on system performance of low power and high performance designs. - Mandeep Bamal; Youssef Travaly; Wenqi Zhang; Michele Stucchi; Karen Maex (SLIP, 2006)

Read Stability and Write-Ability Analysis of SRAM Cells for Nanometer Technologies. - Evelyn Grossar; Michele Stucchi; Karen Maex; Wim Dehaene (IEEE J. Solid State Circuits, 2006)