A new built-in self-test approach for digital-to-analog and analog-to-digital converters. - Karim Arabi; Bozena Kaminska; Janusz Rzeszut (ICCAD, 1994)

An Offset Compensated CMOS Current-Feedback Operational-Amplifier. - Jieyan Zhu; Mohamad Sawan; Karim Arabi (ISCAS, 1995)

Design for testability of integrated operational amplifiers using oscillation-test strategy. - Karim Arabi; Bozena Kaminska; Stephen K. Sunter (ICCD, 1996)

A wireless implantable electrical stimulator based on two FPGAs. - Mohamad Sawan; S. Robin; B. Provost; Y. Eid; Karim Arabi (ICECS, 1996)

Oscillation-test strategy for analog and mixed-signal integrated circuits. - Karim Arabi; Bozena Kaminska (VTS, 1996)

A new digital test approach for analog-to-digital converter testing. - Mehdi Ehsanian; Bozena Kaminska; Karim Arabi (VTS, 1996)

BIST for D/A and A/D Converters. - Karim Arabi; Bozena Kaminska; Janusz Rzeszut (IEEE Des. Test Comput., 1996)

Efficient and accurate testing of analog-to-digital converters using oscillation-test method. - Karim Arabi; Bozena Kaminska (ED&TC, 1997)

Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures. - Karim Arabi; Bozena Kaminska (ICCD, 1997)

Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing. - Karim Arabi; Bozena Kaminska (ITC, 1997)

Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. - Karim Arabi; Bozena Kaminska (ITC, 1997)

Analog and Mixed-Signal Benchmark Circuits-First Release. - Bozena Kaminska; Karim Arabi; I. Bell; José L. Huertas; Bruce C. Kim; Adoración Rueda; Mani Soma; Prashant Goteti (ITC, 1997)

Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. - Karim Arabi; Bozena Kaminska (VTS, 1997)

Testing analog and mixed-signal integrated circuits using oscillation-test method. - Karim Arabi; Bozena Kaminska (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997)

Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation. - Hassan Ihs; Karim Arabi; Bozena Kaminska (ICCD, 1998)

Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. - Karim Arabi; Hassan Ihs; Christian Dufaza; Bozena Kaminska (ITC, 1998)

Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures. - Karim Arabi; Bozena Kaminska (J. Electron. Test., 1998)

Design for testability of embedded integrated operational amplifiers. - Karim Arabi; Bozena Kaminska (IEEE J. Solid State Circuits, 1998)

On chip testing data converters using static parameters. - Karim Arabi; Bozena Kaminska; Mohamad Sawan (IEEE Trans. Very Large Scale Integr. Syst., 1998)

Oscillation-test methodology for low-cost testing of active analog filters. - Karim Arabi; Bozena Kaminska (IEEE Trans. Instrum. Meas., 1999)

Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques. - Mustapha Slamani; Karim Arabi (J. Electron. Test., 2001)

Mixed-Signal BIST: Fact or Fiction. - Karim Arabi (ITC, 2002)

Logic BIST and Scan Test Techniques for Multiple Identical Blocks. - Karim Arabi (VTS, 2002)

Multi-GigaHertz Testing Challenges and Solutions. - Karim Arabi; Klaus-Dieter Hilliges; David C. Keezer; Sassan Tabatabaei (VTS, 2002)

Mixed Signal DFT: A Concise Overview. - Bozena Kaminska; Karim Arabi (ICCAD, 2003)

Overview of the IEEE P1500 Standard. - Francisco DaSilva; Yervant Zorian; Lee Whetsel; Karim Arabi; Rohit Kapur (ITC, 2003)

Mixed RL-Huffman encoding for power reduction and data compression in scan test. - Mohammad H. Tehranipour; Mehrdad Nourani; Karim Arabi; Ali Afzali-Kusha (ISCAS (2), 2004)

Novel Decoupling Capacitor Designs for sub- 90nm CMOS Technology. - Xiongfei Meng; Resve A. Saleh; Karim Arabi (ISQED, 2006)

A Novel Active Decoupling Capacitor Design in 90nm CMOS. - Xiongfei Meng; Karim Arabi; Resve A. Saleh (ISCAS, 2007)

Power Supply Noise in SoCs: Metrics, Management, and Measurement. - Karim Arabi; Resve A. Saleh; Xiongfei Meng (IEEE Des. Test Comput., 2007)

Layout of Decoupling Capacitors in IP Blocks for 90-nm CMOS. - Xiongfei Meng; Resve A. Saleh; Karim Arabi (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Special session 6C: New topic mixed-signal test impact to SoC commercialization. - Karim Arabi (VTS, 2010)

Power noise and its impact on production test and validation of SoC devices. - Karim Arabi (VTS, 2010)

Guest Editorial. - Karim Arabi (J. Electron. Test., 2010)

Leakage power profiling and leakage power reduction using DFT hardware. - Rajamani Sethuram; Karim Arabi; Mohamed H. Abu-Rahma (VTS, 2011)

Low power design techniques in mobile processes. - Karim Arabi (ISLPED, 2014)

3D VLSI: A Scalable Integration Beyond 2D. - Karim Arabi; Kambiz Samadi; Yang Du 001 (ISPD, 2015)

Brain-inspired computing. - Karim Arabi (ITC, 2015)

Edge Computing Trends, Design and Test Challenges - Keynote. - Karim Arabi (VTS, 2021)

Exploring the Landscape of Natural Language Processing Research. - Tim Schopf; Karim Arabi; Florian Matthes (RANLP, 2023)