New insights on the PBTI phenomena in SiON pMOSFETs. - Karina Rott; Hans Reisinger; Stefano Aresu; Christian Schlünder; Klaus Kölpin; Wolfgang Gustin; Tibor Grasser (Microelectron. Reliab., 2012)

Characterization and modeling of charge trapping: From single defects to devices. - Tibor Grasser; Gerhard Rzepa; Michael Waltl; Wolfgang Goes; Karina Rott; Gunnar Andreas Rott; Hans Reisinger; Jacopo Franco; Ben Kaczer (ICICDT, 2014)

Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors. - Gunnar Andreas Rott; Karina Rott; Hans Reisinger; Wolfgang Gustin; Tibor Grasser (Microelectron. Reliab., 2014)

Reliability aspects of copper metallization and interconnect technology for power devices. - Frank Hille; Roman Roth; Carsten Schäffer; Holger Schulze; Nicolas Heuck; Daniel Bolowski; Karsten Guth; Alexander Ciliox; Karina Rott; Frank Umbach; Martin Kerber (Microelectron. Reliab., 2016)