Image sensor for security applications with on-chip data authentication. - Peter Stifter; Kurt Eberhardt; Arnold Erni; Karl Hofmann (Data Mining, Intrusion Detection, Information Assurance, and Data Networks Security, 2006)

Fast stability analysis of large-scale SRAM arrays and the impact of NBTI degradation. - Stefan Drapatz; Thomas Fischer; Karl Hofmann; Ettore Amirante; Peter Huber; Martin Ostermayr; Georg Georgakos; Doris Schmitt-Landsiedel (ESSCIRC, 2009)

Time-differential sense amplifier for sub-80mV bitline voltage embedded STT-MRAM in 40nm CMOS. - Mihail Jefremow; Thomas Kern; Wolf Allers; Christian Peters; Jan Otterstedt; Othmane Bahlous; Karl Hofmann; Robert Allinger; Stephan Kassenetter; Doris Schmitt-Landsiedel (ISSCC, 2013)

Reliability of 28nm embedded RRAM for consumer and industrial products. - Christian Peters; Frank Adler; Karl Hofmann; Jan Otterstedt (IMW, 2022)

Endurance of 2 Mbit Based BEOL Integrated ReRAM. - Nils Kopperberg; Stefan Wiefels; Karl Hofmann; Jan Otterstedt; Dirk J. Wouters; Rainer Waser; Stephan Menzel (IEEE Access, 2022)