Wide frequency range ac electrical characterization of thick-film microvaristors. - M. W. Dudek; Karol Nitsch; Andrzej Dziedzic; Tomasz Piasecki (Microelectron. Reliab., 2011)

Microelectronic materials and structures characterization by impedance spectroscopy. - Karol Nitsch (Microelectron. Reliab., 2011)

Electrical characterization of aluminium oxide-aluminium thin film composites by impedance spectroscopy. - Katarzyna Tadaszak; Karol Nitsch; Tomasz Piasecki; Witold M. Posadowski (Microelectron. Reliab., 2011)