Automatic test pattern generation can be solved as a constraint satisfaction problem. - Károly Tilly; Lászlo Surján; Gyula Román (Microprocess. Microprogramming, 1993)

CONTEST: A Constraint-based Framework for Automatic Test Pattern Generation in Digital Circuits. - Károly Tilly; Lászlo Surján (SCAI, 1995)

A Method for the Construction and Interpretation of High-Level Models for Distributed Fault-Tolerant Systems. - Károly Tilly; István Kiss; Gyula Román; Tadeusz P. Dobrowiecki; Annamária R. Várkonyi-Kóczy (SRDS, 1995)

Semantic User Interfaces. - Károly Tilly; Zoltán Porkoláb (Int. J. Enterp. Inf. Syst., 2010)