Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes. - Shayesteh Masoumian; Roel Maes; Rui Wang; Karthik Keni Yerriswamy; Geert Jan Schrijen; Said Hamdioui; Mottaqiallah Taouil (VLSI-SoC, 2023)

Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes. - Shayesteh Masoumian; Roel Maes; Noemie Beringuier-Boher; Karthik Keni Yerriswamy; Geert Jan Schrijen; Said Hamdioui; Mottaqiallah Taouil (ETS, 2025)