Design and implementation of a time-division multiplexing scan architecture using serializer and deserializer in GPU chips. - Amit Sanghani; Bo Yang; Karthikeyan Natarajan; Chunsheng Liu (VTS, 2011)

Non-uniform DFT implementation for channel simulations in GPU. - Karthikeyan Natarajan; Nitin Chandrachoodan (NCC, 2015)

Dynamic docking architecture for concurrent testing and peak power reduction. - Milind Sonawane; Pavan Kumar Datla Jagannadha; Sailendra Chadalavada; Shantanu Sarangi; Mahmut Yilmaz; Amit Sanghani; Karthikeyan Natarajan; Jonathon E. Colburn; Anubhav Sinha (VTS, 2016)

A programmable method for low-power scan shift in SoC integrated circuits. - Ran Wang 002; Bonita Bhaskaran; Karthikeyan Natarajan; Ayub Abdollahian; Kaushik Narayanun; Krishnendu Chakrabarty; Amit Sanghani (VTS, 2016)

Lossless Parallel Implementation of a Turbo Decoder on GPU. - Karthikeyan Natarajan; Nitin Chandrachoodan (HiPC, 2018)

High Performance Graph Convolutional Networks with Applications in Testability Analysis. - Yuzhe Ma; Haoxing Ren; Brucek Khailany; Harbinder Sikka; Lijuan Luo; Karthikeyan Natarajan; Bei Yu 001 (DAC, 2019)

Power Aware Test. - Likith Kumar Manchukonda; Karthikeyan Natarajan; Manish Arora (ETS, 2022)

Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs. - Khader S. Abdel-Hafez; Michael Dsouza; Likith Kumar Manchukonda; Elddie Tsai; Karthikeyan Natarajan; Ting-Pu Tai; Wenhao Hsueh; Smith Lai (ITC, 2022)

High Speed IO Access for Test forms the foundation for Silicon Lifecycle Management. - Amit Pandey; Brendan Tully; Karthikeyan Natarajan (ITC, 2022)

Novel Technique for Manufacturing & In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed I/O. - Amit Pandey; Brendan Tully; Abhijeet Samudra; Ajay Nagarandal; Karthikeyan Natarajan; Rahul Singhal (VTS, 2022)

Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O. - Amit Pandey; Brendan Tully; Abhijeet Samudra; Ajay Nagarandal; Karthikeyan Natarajan; Rahul Singhal (IEEE Des. Test, 2023)