Robust true random number generator using hot-carrier injection balanced metastable sense amplifiers. - Mudit Bhargava; Kaship Sheikh; Ken Mai (HOST, 2015)

Impact of CNT process imperfection on circuit-level functionality and yield. - Kaship Sheikh; Shu-Jen Han; Lan Wei (ISCAS, 2016)

CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization. - Kaship Sheikh; Shu-Jen Han; Lan Wei (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

Methodology to Capture Statistical Effect of Process Imperfections on Glitch Suppression in CNFET Circuits and to Improve by Using Approximate Circuits. - Kaship Sheikh; Lan Wei (ACM Great Lakes Symposium on VLSI, 2018)

Using approximate circuits to counter process imperfections in CNFET based circuits. - Kaship Sheikh; Lan Wei (VLSI-DAT, 2018)

Reducing Impact of CNFET Process Imperfections on Shape of Activation Function by Using Connection Pruning and Approximate Neuron Circuit. - Kaship Sheikh; Lan Wei (ISQED, 2020)