Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. - Thomas S. Barnett; Matt Grady; Kathleen G. Purdy; Adit D. Singh (ITC, 2002)

Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. - Thomas S. Barnett; Adit D. Singh; Matt Grady; Kathleen G. Purdy (VTS, 2002)

Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. - Thomas S. Barnett; Matt Grady; Kathleen G. Purdy; Adit D. Singh (IEEE Des. Test Comput., 2006)