Effective channel length of MOSFET with halo. - Kazuo Terada; Kazuhiko Sanai; Shouhei Matsuoka; Katsuhiro Tsuji (ICICDT, 2013)

Development of Test Structure for Variability Evaluation using Charge-Based Capacitance Measurement. - Katsuhiro Tsuji; Kazuo Terada; Ryota Kikuchi (IEICE Trans. Electron., 2014)

Study on Threshold Voltage Variation Evaluated by Charge-Based Capacitance Measurement. - Katsuhiro Tsuji; Kazuo Terada; Ryo Takeda; Hisato Fujisaka (IEICE Trans. Electron., 2016)