Reverse short-channel effect due to lateral diffusion of point-defect induced by source/drain ion implantation. - Tatsuya Kunikiyo; Katsuyoshi Mitsui; Masato Fujinaga; Tetsuya Uchida; Norihiko Kotani (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

A precharged-capacitor-assisted sensing (PCAS) scheme with novel level controllers for low-power DRAMs. - Takashi Kono; Takeshi Hamamoto; Katsuyoshi Mitsui; Yasuhiro Konishi; Tsutomu Yoshihara; Hideyuki Ozaki (IEEE J. Solid State Circuits, 2000)

A 0.18-μm 256-Mb DDR-SDRAM with low-cost post-mold tuning method for DLL replica. - Shigehiro Kuge; Tetsuo Kato; Kiyohiro Furutani; Shigeru Kikuda; Katsuyoshi Mitsui; Takeshi Hamamoto; Jun Setogawa; Kei Hamade; Yuichiro Komiya; Satoshi Kawasaki; Takashi Kono; Teruhiko Amano; et al. (IEEE J. Solid State Circuits, 2000)