Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (ASP-DAC, 1997)

Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data. - Katsuyoshi Miura; Kohei Nakata; Koji Nakamae; Hiromu Fujioka (Asian Test Symposium, 1997)

Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (J. Electron. Test., 1997)

Intelligent EB Test System for Automatic VLSI Fault Tracing. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (Asian Test Symposium, 1999)

Development of an EB/FIB Integrated Test System. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (Microelectron. Reliab., 2001)

CAD navigation system, for backside waveform probing of CMOS devices. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (Microelectron. Reliab., 2002)

A low energy FIB processing, repair, and test system. - Katsuyoshi Miura; Tomoyuki Kobatake; Koji Nakamae; Hiromu Fujioka (Microelectron. Reliab., 2003)

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. - Kiyoshi Nikawa; Shoji Inoue; Tatsuoki Nagaishi; Toru Matsumoto 002; Katsuyoshi Miura; Koji Nakamae (IEICE Trans. Electron., 2009)

Laser THz emission microscope as a novel tool for LSI failure analysis. - Masatsugu Yamashita; Chiko Otani; Sunmi Kim; Hironaru Murakami; Masayoshi Tonouchi; Toru Matsumoto 002; Yoshihiro Midoh; Katsuyoshi Miura; Koji Nakamae; Kiyoshi Nikawa (Microelectron. Reliab., 2009)

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization. - Kiyoshi Nikawa; Masatsugu Yamashita; Toru Matsumoto 002; Katsuyoshi Miura; Yoshihiro Midoh; Koji Nakamae (Microelectron. Reliab., 2011)

NBTI/PBTI tolerant arbiter PUF circuits. - Koyo Suzuki; Katsuyoshi Miura; Koji Nakamae (IOLTS, 2017)

Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope. - Katsuyoshi Miura; Atsuki Seko; Koji Nakamae (Microelectron. Reliab., 2018)