Reliability Qualification Challenges of SOCs in Advanced CMOS Process Nodes (Invited). - Shou-En Liu; Jian Li; Deepak Nayak; Amit Marathe; Kaushik Balamukundhan; Vishal Gosavi; Ajaykumar Prajapati; Baha Kilic; Mengzhi Pang; Arpit Mittal (IRPS, 2022)