A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs. - Nilesh Goel; Kaustubh Joshi 003; S. Mukhopadhyay; N. Nanaware; Souvik Mahapatra (Microelectron. Reliab., 2014)

Study of dynamic TDDB in scaled FinFET technologies. - Kaustubh Joshi 003; Shu-Wen Chang; D. S. Huang; P. J. Liao; Yung-Huei Lee (IRPS, 2018)

A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. - Kaustubh Joshi 003; Yung-Huei Lee; Yu-Cheng Yao; Shu-Wen Chang; Siao-Syong Bian; P. J. Liao; Jiaw-Ren Shih; Min-Jan Chen (IRPS, 2019)

PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors. - Soumitra Joy; Kaustubh Joshi 003; Ahmad Zubair; Samuel Bader; Jason Peck; Michael Beumer; Pratik Koirala; Marko Radosavljevic; Heli Vora; Inanc Meric; Han Wui Then (IRPS, 2024)