An infrastructure for accurate characterization of single-event transients in digital circuits. - Varadan Savulimedu Veeravalli; Thomas Polzer; Ulrich Schmid 001; Andreas Steininger; Michael Hofbauer; Kurt Schweiger; Horst Dietrich; Kerstin Schneider-Hornstein; Horst Zimmermann; Kay-Obbe Voss; Bruno Merk; Michael Hajek (Microprocess. Microsystems, 2013)

Techniques for heavy ion microbeam analysis of FPGA SER sensitivty. - Adrian Evans; Dan Alexandrescu; Veronique Ferlet-Cavrois; Kay-Obbe Voss (IRPS, 2015)

A DC-to-8.5 GHz 32 : 1 Analog Multiplexer for On-Chip Continuous-Time Probing of Single-Event Transients in a 65-nm CMOS. - Mladen Mitrovic; Michael Hofbauer; Bernhard Goll; Kerstin Schneider-Hornstein; Robert Swoboda; Bernhard Steindl; Kay-Obbe Voss; Horst Zimmermann (IEEE Trans. Circuits Syst. II Express Briefs, 2017)