Acoustic emission for detecting deterioration of capacitors under aging. - Janusz M. Smulko; Kazimierz Józwiak; Marek Olesz; Lech Hasse (Microelectron. Reliab., 2011)

Quality testing methods of foil-based capacitors. - Janusz M. Smulko; Kazimierz Józwiak; Marek Olesz (Microelectron. Reliab., 2012)