Impact of ISDN on Networks Configuration. - Masato Suyama; Kazuhiko Okada; Seiichi Nakajima (ICC, 1986)

A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. - Takashi Ohzone; Kazuhiko Okada; Takayuki Morishita; Kiyotaka Komoku; Toshihiro Matsuda; Hideyuki Iwata (IEICE Trans. Electron., 2006)