Damage evaluation of wet-chemical silicon-wafer thinning process. - Naoya Watanabe; Takumi Miyazaki; Masahiro Aoyagi; Kazuhiro Yoshikawa (3DIC, 2011)

Some examples of multidimensional Shintani zeta distributions. - Takahiro Aoyama; Kazuhiro Yoshikawa (JSIAM Lett., 2014)