Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis. - Lang Lin; Dinesh Selvakumaran; Deqi Zhu; Norman Chang; Calvin Chow; Makoto Nagata; Kazuki Monta (iSES, 2020)

Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. - Kazuki Monta; Leonidas Katselas; Ferenc Fodor; Alkis A. Hatzopoulos; Makoto Nagata; Erik Jan Marinissen (ETS, 2021)

Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification. - Lang Lin; Deqi Zhu; Jimin Wen; Hua Chen; Yu Lu; Norman Chang; Calvin Chow; Harsh Shrivastav; Chia-Wei Chen; Kazuki Monta; Makoto Nagata (HOST, 2021)

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements. - Kazuki Monta; Leonidas Katselas; Ferenc Fodor; Takuji Miki; Alkis A. Hatzopoulos; Makoto Nagata; Erik Jan Marinissen (IEEE Des. Test, 2022)

On the Unpredictability of SPICE Simulations for Side-Channel Leakage Verification of Masked Cryptographic Circuits. - Kazuki Monta; Makoto Nagata; Josep Balasch; Ingrid Verbauwhede (DAC, 2023)

Characterization of Backside ESD Impacts on Integrated Circuits. - Takuya Wadatsumi; Kohei Kawai; Rikuu Hasegawa; Kazuki Monta; Takuji Miki; Makoto Nagata (IRPS, 2023)

Silicon-correlated Simulation Methodology of EM Side-channel Leakage Analysis. - Kazuki Monta; Lang Lin; Jimin Wen; Harsh Shrivastav; Calvin Chow; Hua Chen; Joao Geada; Sreeja Chowdhury; Nitin Pundir; Norman Chang; Makoto Nagata (ACM J. Emerg. Technol. Comput. Syst., 2023)

Thermal Flow Simuation and Measurements of 3D Si Chip Stacks with TSVs. - Shuhei Yokota; Rikuu Hasegawa; Kazuki Monta; Takaaki Okidono; Takuji Miki; Makoto Nagata (3DIC, 2024)

A Hybrid Simulation Approach for Accurate and Fast System-Level Side-Channel Leakage Evaluation. - Kazuki Monta; Takafumi Oki; Rikuu Hasegawa; Takuya Wadatsumi; Takuji Miki; Makoto Nagata; Lang Lin; Norman Chang (AsianHOST, 2024)

On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. - Rikuu Hasegawa; Kazuki Monta; Takuya Wadatsumi; Takuji Miki; Makoto Nagata (COSADE, 2024)

Modeling and Analysis of On-Chip Voltage Fluctuations Caused by Electromagnetic Fault Injection. - Takuya Wadatsumi; Rikuu Hasegawa; Kazuki Monta; Takuji Miki; Lang Lin; Norman Chang; Makoto Nagata (EMC Compo, 2024)

Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips. - Yusuke Hayashi; Rikuu Hasegawa; Takuya Wadatsumi; Kazuki Monta; Takuji Miki; Makoto Nagata (FDTC, 2024)

Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation. - Henian Li; Lang Lin; Norman Chang; Sreeja Chowdhury; Dylan Mcguire; Bozidar Novakovic; Kazuki Monta; Makoto Nagata; Ying-Shiun Li; Pramod M. S; Piin-Chen Yeh; Jyh-Shing Roger Jang; et al. (HOST, 2024)

Si-Backside Side-Channel Leakage Measurement and Simulation. - Rikuu Hasegawa; Kazuki Monta; Takuya Wadatsumi; Takuji Miki; Makoto Nagata; Lang Lin; Akhilesh Kumar; Norman Chang (ISOCC, 2024)

ML-EMFI: A Machine Learning-Driven Pre-Silicon Electromagnetic Fault Injection Security Evaluation for Robust IC Design. - Pantha Protim Sarker; Tianze Kan; Jingchen Liang; Ozgur Tuncer; Bo He; Zelin Lu; Sudarshan Mallu; Lang Lin; Norman Chang; Rikuu Hasegawa; Kazuki Monta; Makoto Nagata; et al. (HOST, 2025)