CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. - Kazunari Enokimoto; Xiaoqing Wen; Yuta Yamato; Kohei Miyase; H. Sone; Seiji Kajihara; Masao Aso; Hiroshi Furukawa (Asian Test Symposium, 2009)

Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. - Kohei Miyase; Y. Uchinodan; Kazunari Enokimoto; Yuta Yamato; Xiaoqing Wen; Seiji Kajihara; Fangmei Wu; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Arnaud Virazel (Asian Test Symposium, 2011)

SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. - Michael A. Kochte; Kohei Miyase; Xiaoqing Wen; Seiji Kajihara; Yuta Yamato; Kazunari Enokimoto; Hans-Joachim Wunderlich (ISLPED, 2011)

Power-aware test generation with guaranteed launch safety for at-speed scan testing. - Xiaoqing Wen; Kazunari Enokimoto; Kohei Miyase; Yuta Yamato; Michael A. Kochte; Seiji Kajihara; Patrick Girard 001; Mohammad Tehranipoor (VTS, 2011)

A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. - Kohei Miyase; Masao Aso; Ryou Ootsuka; Xiaoqing Wen; Hiroshi Furukawa; Yuta Yamato; Kazunari Enokimoto; Seiji Kajihara (VTS, 2012)

On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. - Kazunari Enokimoto; Xiaoqing Wen; Kohei Miyase; Jiun-Lang Huang; Seiji Kajihara; Laung-Terng Wang (VLSI Design, 2013)