Long-term Memory of Foreign-word Learning by Short Movies for iPods. - Satoko Amemiya; Kazunori Hasegawa; Keiichi Kaneko; Haruko Miyakoda; Wataru Tsukahara (ICALT, 2007)

Autonomous and collaborative learning environment for vocabulary acquirement. - Keiichi Kaneko; Kazunori Hasegawa; Xin Jin; Masatoshi Ishikawa; Norihide Shinagawa; Haruko Miyakoda (ITI, 2008)

Short-circuit protection for an IGBT with detecting the gate voltage and gate charge. - Kazunori Hasegawa; Kenichi Yamamoto; Hidetaro Yoshida; Kota Hamada; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2014)

Temperature rise measurement for power-loss comparison of an aluminum electrolytic capacitor between sinusoidal and square-wave current injections. - Kazunori Hasegawa; Kentaro Kozuma; Kousuke Tsuzaki; Ichiro Omura; Shinichi Nishizawa (Microelectron. Reliab., 2016)

Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter. - Kazunori Hasegawa; Ichiro Omura; Shinichi Nishizawa (IEEE Trans. Ind. Electron., 2016)

Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications. - Seiya Abe; Kazunori Hasegawa; Masanori Tsukuda; Keiji Wada; Ichiro Omura; Tamotsu Ninomiya (Microelectron. Reliab., 2017)

Clamp type built-in current sensor using PCB in high-voltage power modules. - Masanori Tsukuda; K. Nakashima; S. Tabata; Kazunori Hasegawa; Ichiro Omura (Microelectron. Reliab., 2017)

Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system. - Bat-Otgon Bat-Ochir; Battuvshin Bayarkhuu; Kazunori Hasegawa; Masanori Tsukuda; Bayasgalan Dugarjav; Ichiro Omura (Microelectron. Reliab., 2018)

ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier. - Kazunori Hasegawa; Shinichi Nishizawa; Ichiro Omura (Microelectron. Reliab., 2018)

DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors. - Kazunori Hasegawa; Kousuke Tsuzaki; Shinichi Nishizawa (Microelectron. Reliab., 2018)

Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena. - Masanori Tsukuda; Seiya Abe; Kazunori Hasegawa; Tamotsu Ninomiya; Ichiro Omura (Microelectron. Reliab., 2018)