Degradation mechanisms of GaAs PHEMTs in high humidity conditions. - Takayuki Hisaka; Yasuki Aihara; Yoichi Nogami; Hajime Sasaki; Yasushi Uehara; Naohito Yoshida; Kazuo Hayashi (Microelectron. Reliab., 2005)

Temperature Dependence of Toluene Decomposition Behavior in the Discharge-Catalyst Hybrid Reactor. - Kazuo Hayashi; Hiroyuki Yasui; Motofumi Tanaka; Shigeru Futamura; Satoshi Kurita; Kenichi Aoyagi (IAS, 2007)

Decrease in on-state gate current of AlGaN/GaN HEMTs by recombination-enhanced defect reaction of generated hot carriers investigated by TCAD simulation. - Hajime Sasaki; Kaoru Kadoiwa; Hidetoshi Koyama; Yoshitaka Kamo; Yoshitsugu Yamamoto; Toshiyuki Oishi; Kazuo Hayashi (Microelectron. Reliab., 2014)