Constant-charge-injection programming: a novel high-speed programming method for multilevel flash memories. - Hideaki Kurata; Shunichi Saeki; Takashi Kobayashi 002; Yoshitaka Sasago; Tsuyoshi Arigane; Kazuo Otsuga; Takayuki Kawahara (IEEE J. Solid State Circuits, 2005)

A 126 mm2 4-Gb Multilevel AG-AND Flash Memory with Inversion-Layer-Bit-Line Technology. - Hideaki Kurata; Satoshi Noda; Yoshitaka Sasago; Kazuo Otsuga; Tsuyoshi Arigane; Tetsufumi Kawamura; Takashi Kobayashi 002; Hitoshi Kume; Kazuki Homma; Teruhiko Ito; Yoshinori Sakamoto; Masahiro Shimizu; et al. (IEICE Trans. Electron., 2007)

Selective-Capacitance Constant-Charge-Injection Programming Scheme for High-Speed Multilevel AG-AND Flash Memories. - Kazuo Otsuga; Hideaki Kurata; Satoshi Noda; Yoshitaka Sasago; Tsuyoshi Arigane; Tetsufumi Kawamura; Takashi Kobayashi 002 (IEICE Trans. Electron., 2007)

Random Telegraph Signal in Flash Memory: Its Impact on Scaling of Multilevel Flash Memory Beyond the 90-nm Node. - Hideaki Kurata; Kazuo Otsuga; Akira Kotabe; Shinya Kajiyama; Taro Osabe; Yoshitaka Sasago; Shunichi Narumi; Kenji Tokami; Shiro Kamohara; Osamu Tsuchiya (IEEE J. Solid State Circuits, 2007)

A Design of Constant-Charge-Injection Programming Scheme for AG-AND Flash Memories Using Array-Level Analytical Model. - Shinya Kajiyama; Ken'ichiro Sonoda; Kazuo Otsuga; Hideaki Kurata; Kiyoshi Ishikawa (IEICE Trans. Electron., 2008)

A 1.39-V input fast-transient-response digital LDO composed of low-voltage MOS transistors in 40-nm CMOS process. - Masafumi Onouchi; Kazuo Otsuga; Yasuto Igarashi; Toyohito Ikeya; Sadayuki Morita; Koichiro Ishibashi; Kazumasa Yanagisawa (A-SSCC, 2011)

An on-chip 250 mA 40 nm CMOS digital LDO using dynamic sampling clock frequency scaling with offset-free TDC-based voltage sensor. - Kazuo Otsuga; Masafumi Onouchi; Yasuto Igarashi; Toyohito Ikeya; Sadayuki Morita; Koichiro Ishibashi; Kazumasa Yanagisawa (SoCC, 2012)

Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor. - Takao Nomura; Ryo Mori; Munehiro Ito; Koji Takayanagi; Toshihiko Ochiai; Kazuki Fukuoka; Kazuo Otsuga; Koji Nii; Sadayuki Morita; Tomoaki Hashimoto; Tsuyoshi Kida; Junichi Yamada; et al. (CICC, 2013)