Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions. - Jia Hao Lim; Nagarajan Raghavan; Vinayak Bharat Naik; Jae Hyun Kwon; Kazutaka Yamane; H. Yang; K. H. Lee; Kin Leong Pey (IRPS, 2019)

Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production. - Tae Young Lee; Kazutaka Yamane; Lee Yong Hau; Robin Chao; Nyuk Leong Chung; Vinayak Bharat Naik; K. Sivabalan; Jae Hyun Kwon; Jia Hao Lim; Wah-Peng Neo; Kevin Khua; Naganivetha Thiyagarajah; et al. (IRPS, 2020)

Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM. - Jia Hao Lim; Nagarajan Raghavan; Jae Hyun Kwon; Tae Young Lee; Robin Chao; Nyuk Leong Chung; Kazutaka Yamane; Naganivetha Thiyagarajah; Vinayak Bharat Naik; Kin Leong Pey (IRPS, 2020)

MRAM-based BER resilient Quantized edge-AI Networks for Harsh Industrial Conditions. - Vivek Parmar; Manan Suri; Kazutaka Yamane; Tae Young Lee; Nyuk Leong Chung; Vinayak Bharat Naik (AICAS, 2021)

A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement. - Nishtha S. Gaul; Akhilesh Jaiswal 002; Hongsik Yoon; Taeyoung Lee; Kazutaka Yamane; Joseph Versaggi; Rick Carter; Bipul C. Paul (IMW, 2022)

From Emergence to Prevalence: 22FDX® Embedded STT-MRAM. - Johannes Müller; Aleksandra Titova; Hongsik Yoon; Thomas Merbeth; Martin Weisheit; Georg Wolf; Sanjeeb Bharali; Bert Pfefferling; Yuichi Otani; Tetyana Shapoval; Alberto Cagliani; Ferenc Vajda; et al. (IMW, 2022)

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. - Vinayak Bharat Naik; J. H. Lim; Kazutaka Yamane; J. Kwon; Behin-Aein B.; N. L. Chung; S. K 001; R. Chao; C. Chiang; Y. Huang; L. Pu; Yuichi Otani; et al. (IRPS, 2022)