Reliability issues of silicon LSIs facing 100-nm technology node. - Eiji Takeda; Eiichi Murakami; Kazuyoshi Torii; Yutaka Okuyama; Eishi Ebe; Kenji Hinode; Shin'ichiro Kimura (Microelectron. Reliab., 2002)

Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs. - Takeo Matsuki; Kazuyoshi Torii; Takeshi Maeda; Yasushi Akasaka; Kiyoshi Hayashi; Naoki Kasai; Tsunetoshi Arikado (IEICE Trans. Electron., 2005)