Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Salvador Mir (Asian Test Symposium, 2010)

Fault diagnosis of analog circuits based on machine learning. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Salvador Mir (DATE, 2010)

Parametric counterfeit IC detection via Support Vector Machines. - Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (DFT, 2012)

Spatial correlation modeling for probe test cost reduction in RF devices. - Nathan Kupp; Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (ICCAD, 2012)

Accurate estimation of analog test metrics with extreme circuits. - Kamel Beznia; Ahcène Bounceur; Louay Abdallah; Ke Huang 001; Salvador Mir; Reinhardt Euler (ICECS, 2012)

Spatial estimation of wafer measurement parameters using Gaussian process models. - Nathan Kupp; Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (ITC, 2012)

Diagnosis of Local Spot Defects in Analog Circuits. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Salvador Mir; Camelia Hora; Yizi Xing; Bram Kruseman (IEEE Trans. Instrum. Meas., 2012)

Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (DATE, 2013)

Multivariate statistical techniques for analog parametric test metrics estimation. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Louay Abdallah; Salvador Mir; Ahcène Bounceur (DTIS, 2013)

On combining alternate test with spatial correlation modeling in analog/RF ICs. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (ETS, 2013)

Reconciling the IC test and security dichotomy. - Ozgur Sinanoglu; Naghmeh Karimi; Jeyavijayan Rajendran; Ramesh Karri; Yier Jin; Ke Huang 001; Yiorgos Makris (ETS, 2013)

Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. - Ke Huang 001; John M. Carulli; Yiorgos Makris (ITC, 2013)

Process monitoring through wafer-level spatial variation decomposition. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (ITC, 2013)

Fault modeling and diagnosis for nanometric analog circuits. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Salvador Mir (ITC, 2013)

Hardware Trojan Detection through Golden Chip-Free Statistical Side-Channel Fingerprinting. - Yu Liu; Ke Huang 001; Yiorgos Makris (DAC, 2014)

Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. - Ali Ahmadi; Ke Huang 001; Suriyaprakash Natarajan; John M. Carulli Jr.; Yiorgos Makris (ITC, 2014)

IC laser trimming speed-up through wafer-level spatial correlation modeling. - Constantinos Xanthopoulos; Ke Huang 001; Abbas Poonawala; Amit Nahar; Bob Orr; John M. Carulli Jr.; Yiorgos Makris (ITC, 2014)

Innovative practices session 4C: Disruptive solutions in the non-digital world. - Amitava Majumdar 002; Suriya Natarajan; Stephen K. Sunter; Prashant Goteti; Ke Huang 001 (VTS, 2014)

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain. - Ujjwal Guin; Ke Huang 001; Daniel DiMase; John M. Carulli; Mohammad Tehranipoor; Yiorgos Makris (Proc. IEEE, 2014)

Concurrent hardware Trojan detection in wireless cryptographic ICs. - Yu Liu; Georgios Volanis; Ke Huang 001; Yiorgos Makris (ITC, 2015)

A comparative study of one-shot statistical calibration methods for analog / RF ICs. - Yichuan Lu; Kiruba S. Subramani; He Huang; Nathan Kupp; Ke Huang 001; Yiorgos Makris (ITC, 2015)

Yield prognosis for fab-to-fab product migration. - Ali Ahmadi; Ke Huang 001; Amit Nahar; Bob Orr; Michael Pas; John M. Carulli; Yiorgos Makris (VTS, 2015)

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. - Ke Huang 001; Nathan Kupp; Constantinos Xanthopoulos; John M. Carulli Jr.; Yiorgos Makris (IEEE Des. Test, 2015)

Recycled IC Detection Based on Statistical Methods. - Ke Huang 001; Yu Liu; Nenad Korolija; John M. Carulli; Yiorgos Makris (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Prognosis of NBTI aging using a machine learning scheme. - Naghmeh Karimi; Ke Huang 001 (DFT, 2016)

Test-Suite-Based Analog/RF Test Time Reduction Using Canonical Correlation. - Ke Huang 001; Jian Wen; Jim Willmore (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. - Ali Ahmadi; Haralampos-G. D. Stratigopoulos; Ke Huang 001; Amit Nahar; Bob Orr; Michael Pas; John M. Carulli; Yiorgos Makris (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

IC layout weak point effectiveness evaluation based on statistical methods. - Fang Lin; Ali Ahmadi; Kannan Sekar; Yan Pan; Ke Huang 001 (VTS, 2018)

AgileNet: Lightweight Dictionary-based Few-shot Learning. - Mohammad Ghasemzadeh 002; Fang Lin; Bita Darvish Rouhani; Farinaz Koushanfar; Ke Huang 001 (CoRR, 2018)

Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing. - Ke Huang 001; Manuel J. Barragán (J. Electron. Test., 2018)

Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. - Parth Kansara; Sharanabasavaraja Bheema Reddy; Louay Abdallah; Ke Huang 001 (J. Electron. Test., 2018)

Ecological Driving System for Connected/Automated Vehicles Using a Two-Stage Control Hierarchy. - Ke Huang 001; Xianfeng Terry Yang; Yang Lu; Chunting Chris Mi; Prathyusha Kondlapudi (IEEE Trans. Intell. Transp. Syst., 2018)

Real-Time Prediction for IC Aging Based on Machine Learning. - Ke Huang 001; Xinqiao Zhang; Naghmeh Karimi (IEEE Trans. Instrum. Meas., 2019)

On the Application of Binary Neural Networks in Oblivious Inference. - Mohammad Samragh; Siam U. Hussain; Xinqiao Zhang; Ke Huang 001; Farinaz Koushanfar (CVPR Workshops, 2021)

Real-Time IC Aging Prediction via On-Chip Sensors. - Ke Huang 001; Md Toufiq Hasan Anik; Xinqiao Zhang; Naghmeh Karimi (ISVLSI, 2021)

Eco-Driving System for Connected Automated Vehicles: Multi-Objective Trajectory Optimization. - Xianfeng Terry Yang; Ke Huang 001; Zhehao Zhang; Zhao Alan Zhang; Fang Lin (IEEE Trans. Intell. Transp. Syst., 2021)

FaceSigns: Semi-Fragile Neural Watermarks for Media Authentication and Countering Deepfakes. - Paarth Neekhara; Shehzeen Hussain; Xinqiao Zhang; Ke Huang 001; Julian J. McAuley; Farinaz Koushanfar (CoRR, 2022)

An Adaptive Black-box Backdoor Detection Method for Deep Neural Networks. - Xinqiao Zhang; Huili Chen; Ke Huang 001; Farinaz Koushanfar (CoRR, 2022)

DEVoT: Dynamic Delay Modeling of Functional Units Under Voltage and Temperature Variations. - Dongning Ma; Xinqiao Zhang; Ke Huang 001; Yu Jiang 001; Wanli Chang 001; Xun Jiao (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

zPROBE: Zero Peek Robustness Checks for Federated Learning. - Zahra Ghodsi; Mojan Javaheripi; Nojan Sheybani; Xinqiao Zhang; Ke Huang 001; Farinaz Koushanfar (ICCV, 2023)

AdaTest: Reinforcement Learning and Adaptive Sampling for On-chip Hardware Trojan Detection. - Huili Chen; Xinqiao Zhang; Ke Huang 001; Farinaz Koushanfar (ACM Trans. Embed. Comput. Syst., 2023)

Unveiling Analog Aging Trojans (ATs): Vulnerabilities and Detection Strategies. - Ke Huang 001; Xinqiao Zhang; Farinaz Koushanfar (MWSCAS, 2024)

Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. - Ke Huang 001; Yu Liu; Nenad Korolija; John M. Carulli; Yiorgos Makris (IEEE Des. Test, 2024)

Scalable Binary Neural Network Applications in Oblivious Inference. - Xinqiao Zhang; Mohammad Samragh; Siam U. Hussain; Ke Huang 001; Farinaz Koushanfar (ACM Trans. Embed. Comput. Syst., 2024)

FaceSigns: Semi-fragile Watermarks for Media Authentication. - Paarth Neekhara; Shehzeen Hussain; Xinqiao Zhang; Ke Huang 001; Julian J. McAuley; Farinaz Koushanfar (ACM Trans. Multim. Comput. Commun. Appl., 2024)