New Particle Filter Based on GA for Equipment Remaining Useful Life Prediction. - Ke Li 038; Jingjing Wu; Qiuju Zhang; Lei Su 002; Peng Chen 002 (Sensors, 2017)

Using GA-SVM for defect inspection of flip chips based on vibration signals. - Ke Li 038; Lingyu Wang 005; Jingjing Wu; Qiuju Zhang; Guanglan Liao; Lei Su 002 (Microelectron. Reliab., 2018)

A New Rotation Machinery Fault Diagnosis Method Based on Deep Structure and Sparse Least Squares Support Vector Machine. - Ke Li 038; Rui Zhang; Fucai Li; Lei Su 002; Huaqing Wang; Peng Chen 002 (IEEE Access, 2019)

Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound. - Lei Su 002; Xiaonan Yu; Ke Li 038; Xingyan Yao; Michael G. Pecht (IEEE Access, 2019)

A novel fault diagnosis algorithm for rotating machinery based on a sparsity and neighborhood preserving deep extreme learning machine. - Ke Li 038; Meng Xiong; Fucai Li; Lei Su 002; Jingjing Wu (Neurocomputing, 2019)

Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation. - Lei Su 002; Xiaonan Yu; Ke Li 038; Jiefei Gu; Michael G. Pecht (IEEE Trans. Ind. Electron., 2021)

A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. - Yu Sun; Lei Su 002; Jiefei Gu; Ke Li 038; Michael G. Pecht (IEEE Trans. Instrum. Meas., 2023)

Flip-chip solder bumps defect detection using a self-search lightweight framework. - Yu Sun; Lei Su 002; Jiefei Gu; Xinwei Zhao; Ke Li 038; Michael G. Pecht (Adv. Eng. Informatics, 2024)

Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection. - Siyu Zhang; Lei Su 002; Jiefei Gu; Ke Li 038; Weitian Wu; Michael G. Pecht (Expert Syst. Appl., 2024)

Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection. - Yu Sun; Lei Su 002; Jiefei Gu; Xinwei Zhao; Ke Li 038; Michael G. Pecht (IEEE Trans. Ind. Informatics, 2024)

Semi-supervised dual-constraint centroid contrastive prototypical network for flip chip defect detection under limited labeled data. - Yunxia Lou; Lei Su 002; Jiefei Gu; Xinwei Zhao; Ke Li 038; Michael G. Pecht (Eng. Appl. Artif. Intell., 2025)