A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics. - Ke-Wei Su; Yi-Ming Sheu; Chung-Kai Lin; Sheng-Jier Yang; Wen-Jya Liang; Xuemei Xi; Chung-Shi Chiang; Jaw-Kang Her; Yu-Tai Chia; Carlos H. Diaz; Chenming Hu (CICC, 2003)

Modeling well edge proximity effect on highly-scaled MOSFETs. - Yi-Ming Sheu; Ke-Wei Su; Sheng-Jier Yang; Hsien-Te Chen; Chih-Chiang Wang 003; Ming-Jer Chen; S. Liu (CICC, 2005)

Suspicious URL Filtering Based on Logistic Regression with Multi-view Analysis. - Ke-Wei Su; Kuo-Ping Wu; Hahn-Ming Lee; Te-En Wei (AsiaJCIS, 2013)

Circuit reliability simulation using TMI2. - Min-Chie Jeng; Cheng Hsiao; Ke-Wei Su; Chung-Kai Lin (CICC, 2013)