Partial Scan by Use of Empirical Testability. - Kee Sup Kim; Charles R. Kime (ICCAD, 1990)

Partial Scan Using Reverse Direction Empirical Testability. - Kee Sup Kim; Charles R. Kime (ITC, 1993)

Multi-Frequency, Multi-Phase Scan Chain. - Kee Sup Kim; Len Schultz (ITC, 1994)

Partial scan flip-flop selection by use of empirical testability. - Kee Sup Kim; Charles R. Kime (J. Electron. Test., 1995)

SpeedGrade: An RTL Path Delay Fault Simulator. - Kee Sup Kim; Rathish Jayabharathi; Craig Carstens (Asian Test Symposium, 2001)

DPDAT: data path direct access testing. - Kee Sup Kim; Rathish Jayabharathi; Craig Carstens; Praveen Vishakantaiah; Derek Feltham; Adrian Carbine (ITC, 2001)

X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. - Subhasish Mitra; Kee Sup Kim (ITC, 2002)

XMAX: X-Tolerant Architecture for MAXimal Test Compression. - Subhasish Mitra; Kee Sup Kim (ICCD, 2003)

H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. - David M. Wu; Mike Lin; Subhasish Mitra; Kee Sup Kim; Anil Sabbavarapu; Talal Jaber; Pete Johnson; Dale March; Greg Parrish (ITC, 2003)

Delay Defect Characteristics and Testing Strategies. - Kee Sup Kim; Subhasish Mitra; Paul G. Ryan (IEEE Des. Test Comput., 2003)

X-compact: an efficient response compaction technique. - Subhasish Mitra; Kee Sup Kim (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Robust platform design in advanced VLSI technologies. - David J. Leavins; Kee Sup Kim; Subhasish Mitra; Eddie J. Rodriguez (CICC, 2005)

How to determine the necessity for emerging solutions. - Nic Mokhoff; Yervant Zorian; Kamalesh N. Ruparel; Hao Nham; Francesco Pessolano; Kee Sup Kim (DAC, 2005)

XMAX: a practical and efficient compression architecture. - Kee Sup Kim (ITC, 2005)

Logic soft errors: a major barrier to robust platform design. - Subhasish Mitra; Ming Zhang 017; T. M. Mak; Norbert Seifert; Victor Zia; Kee Sup Kim (ITC, 2005)

Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. - Subhasish Mitra; Norbert Seifert; Ming Zhang 017; Quan Shi; Kee Sup Kim (Computer, 2005)

OCI: Open Compression Interface. - Bruce Cory; Rohit Kapur; Mick Tegethoff; Mark Kassab; Brion L. Keller; Kee Sup Kim; Dwayne Burek; Steven F. Oakland; Benoit Nadeau-Dostie (ITC, 2006)

Combinational Logic Soft Error Correction. - Subhasish Mitra; Ming Zhang 017; Saad Waqas; Norbert Seifert; Balkaran S. Gill; Kee Sup Kim (ITC, 2006)

Soft Error Resilient System Design through Error Correction. - Subhasish Mitra; Ming Zhang 017; Norbert Seifert; T. M. Mak; Kee Sup Kim (VLSI-SoC (Selected Papers), 2006)

Session Abstract. - Kee Sup Kim; Mohammad Tehranipoor (VTS, 2006)

XPAND: An Efficient Test Stimulus Compression Technique. - Subhasish Mitra; Kee Sup Kim (IEEE Trans. Computers, 2006)

Sequential Element Design With Built-In Soft Error Resilience. - Ming Zhang 017; Subhasish Mitra; T. M. Mak; Norbert Seifert; Nicholas J. Wang; Quan Shi; Kee Sup Kim; Naresh R. Shanbhag; Sanjay J. Patel (IEEE Trans. Very Large Scale Integr. Syst., 2006)

Design for Resilience to Soft Errors and Variations. - Ming Zhang 017; T. M. Mak; James W. Tschanz; Kee Sup Kim; Norbert Seifert; Davia Lu (IOLTS, 2007)

Hierarchical Test Compression for SoC Designs. - Kee Sup Kim; Ming Zhang 017 (IEEE Des. Test Comput., 2008)

Framework for massively parallel testing at wafer and package test. - A. Hakan Baba; Kee Sup Kim (ICCD, 2009)

Panel: Apprentice - VTS Edition: Season 2. - Kee Sup Kim (VTS, 2009)

Panel 4A: Apprentice - VTS edition: Season 3. - Kee Sup Kim (VTS, 2010)

Panel 12C: Apprentice - VTS edition judging session. - Kee Sup Kim (VTS, 2010)

Holistic low power solutions for the new world. - Kee Sup Kim (ISLPED, 2011)

Apprentice - VTS edition: Season 4. - Kee Sup Kim; Rob Roy (VTS, 2011)

A 0.65V embedded SDRAM with smart boosting and power management in a 45nm CMOS technology. - Suk-Soo Pyo; Jun-Sung Kim; Jung-Han Kim; Hyun-Taek Jung; Taejoong Song; Cheol-Ha Lee; Gyun-Hong Kim; Young-Keun Lee; Kee Sup Kim (CICC, 2012)

Thermal-aware body bias modulation for high performance mobile core. - Chungki Oh; Hyung-Ock Kim; Jun Seomun; Wook Kim; Jaehan Jeon; Kyung Tae Do; Hyo-Sig Won; Kee Sup Kim (ISOCC, 2012)

Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. - Young Moon Kim; Jun Seomun; Hyung-Ock Kim; Kyung Tae Do; Jung Yun Choi; Kee Sup Kim; Matthias Sauer 002; Bernd Becker 001; Subhasish Mitra (CICC, 2013)

Early-life-failure detection using SAT-based ATPG. - Matthias Sauer 002; Young Moon Kim; Jun Seomun; Hyung-Ock Kim; Kyung Tae Do; Jung Yun Choi; Kee Sup Kim; Subhasish Mitra; Bernd Becker 001 (ITC, 2013)

13.2 A 14nm FinFET 128Mb 6T SRAM with VMIN-enhancement techniques for low-power applications. - Taejoong Song; Woojin Rim; Jonghoon Jung; Giyong Yang; Jaeho Park; Sunghyun Park 003; Kang-Hyun Baek; Sanghoon Baek; Sang-Kyu Oh; Jinsuk Jung; Sungbong Kim; Gyu-Hong Kim; et al. (ISSCC, 2014)