TFT-LCD Application Specific Low Power SRAM Using Charge-Recycling Technique. - Keejong Kim; Chris H. Kim; Kaushik Roy 001 (ISQED, 2005)

Self-calibration technique for reduction of hold failures in low-power nano-scaled SRAM. - Swaroop Ghosh; Saibal Mukhopadhyay; Keejong Kim; Kaushik Roy 001 (DAC, 2006)

Low-Power and Process Variation Tolerant Memories in sub-90nm Technologies. - Saibal Mukhopadhyay; Swaroop Ghosh; Keejong Kim; Kaushik Roy 001 (SoCC, 2006)

Process-Tolerant Low-Power Adaptive Pipeline under Scaled-Vdd. - Swaroop Ghosh; Pooja Batra; Keejong Kim; Kaushik Roy 001 (CICC, 2007)

Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. - Kunhyuk Kang; Keejong Kim; Ahmad E. Islam; Muhammad Ashraful Alam; Kaushik Roy 001 (DAC, 2007)

Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop. - Kunhyuk Kang; Keejong Kim; Kaushik Roy 001 (DAC, 2007)

A low-power SRAM using bit-line charge-recycling technique. - Keejong Kim; Hamid Mahmoodi; Kaushik Roy 001 (ISLPED, 2007)

A 160 mV, fully differential, robust schmitt trigger based sub-threshold SRAM. - Jaydeep P. Kulkarni; Keejong Kim; Kaushik Roy 001 (ISLPED, 2007)

FinFET Based SRAM Design for Low Standby Power Applications. - Tamer Cakici; Keejong Kim; Kaushik Roy 001 (ISQED, 2007)

A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM. - Jaydeep P. Kulkarni; Keejong Kim; Kaushik Roy 001 (IEEE J. Solid State Circuits, 2007)

Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS. - Saibal Mukhopadhyay; Keejong Kim; Hamid Mahmoodi; Kaushik Roy 001 (IEEE J. Solid State Circuits, 2007)

Process variation tolerant SRAM array for ultra low voltage applications. - Jaydeep P. Kulkarni; Keejong Kim; Sang Phill Park; Kaushik Roy 001 (DAC, 2008)

A Low-Power SRAM Using Bit-Line Charge-Recycling. - Keejong Kim; Hamid Mahmoodi; Kaushik Roy 001 (IEEE J. Solid State Circuits, 2008)

On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures. - Kunhyuk Kang; Sang Phill Park; Keejong Kim; Kaushik Roy 001 (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Robust Level Converter for Sub-Threshold/Super-Threshold Operation: 100 mV to 2.5 V. - Ik Joon Chang; Jae-Joon Kim; Keejong Kim; Kaushik Roy 001 (IEEE Trans. Very Large Scale Integr. Syst., 2011)