Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. - Ivo Schanstra; Dharmajaya Lukita; Ad J. van de Goor; Kees Veelenturf; Paul J. van Wijnen (ITC, 1998)

The Road to Better Reliability and Yield Embedded DfM Tools. - Kees Veelenturf (DATE, 2000)

Tutorial Statement. - Yervant Zorian; Michael Nicolaidis; Peter Muhmenthaler; David Y. Lepejian; Chris W. H. Strolenberg; Kees Veelenturf (DATE, 2000)