System-level BIT false alarm reducing technology based on sensor network time stress analysis and the fault propagation correlation model. - Kehong Lv; Zhiao Zhao; Jing Qiu; Guanjun Liu; Peng Yang (Int. J. Sens. Networks, 2012)

A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function. - Chenxu Zhao; Krishna R. Pattipati; Guanjun Liu; Jing Qiu; Kehong Lv; Tianmei Li 001 (IEEE Trans. Syst. Man Cybern. Syst., 2016)

Impact of Electrical Contact Resistance on the High-Speed Transmission and On-Line Diagnosis of Electrical Connector Intermittent Faults. - Qinmu Shen; Kehong Lv; Guanjun Liu; Jing Qiu (IEEE Access, 2017)