Direct observation of changes in the effective minority-carrier lifetime of SiNx-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests. - Naoyuki Nishikawa; Seira Yamaguchi; Keisuke Ohdaira (Microelectron. Reliab., 2017)

Multistage performance deterioration in n-type crystalline silicon photovoltaic modules undergoing potential-induced degradation. - Yutaka Komatsu; Seira Yamaguchi; Atsushi Masuda; Keisuke Ohdaira (Microelectron. Reliab., 2018)