Ion microbeam probing of sense amplifiers to analyze single event upsets in a CMOS DRAM. - Linda M. Geppert; Urs Bapst; David F. Heidel; Keith A. Jenkins (IEEE J. Solid State Circuits, 1991)

Internal node probing of a DRAM with a low-temperature e-beam tester. - Keith A. Jenkins; Walter H. Henkels (IEEE J. Solid State Circuits, 1991)

Measurement of VLSI power supply current by electron-beam probing. - Keith A. Jenkins; Robert L. Franch (IEEE J. Solid State Circuits, 1992)

A 2.4-GHz silicon bipolar oscillator with integrated resonator. - Mehmet Soyuer; Keith A. Jenkins; Joachim N. Burghartz; Herschel A. Ainspan; Frank J. Canora; Slaila Ponnapalli; John F. Ewen; William E. Pence (IEEE J. Solid State Circuits, 1996)

A 3-V 4-GHz nMOS voltage-controlled oscillator with integrated resonator. - Mehmet Soyuer; Keith A. Jenkins; Joachim N. Burghartz; Michael D. Hulvey (IEEE J. Solid State Circuits, 1996)

Detecting and Preventing Measurement Errors. - Keith A. Jenkins (IEEE Des. Test Comput., 1997)

Integrated RF components in a SiGe bipolar technology. - Joachim N. Burghartz; Mehmet Soyuer; Keith A. Jenkins; Michael Kies; Margaret Dolan; Kenneth J. Stein; John Malinowski; David L. Harame (IEEE J. Solid State Circuits, 1997)

An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator. - Mehmet Soyuer; Joachim N. Burghartz; Herschel A. Ainspan; Keith A. Jenkins; Peter Xiao; Arvin R. Shahani; Margaret S. Dolan; David L. Harame (IEEE J. Solid State Circuits, 1997)

Designing a Testable System on a Chip. - Stephen V. Kosonocky; Arthur A. Bright; Kevin W. Warren; Ruud A. Haring; Steve Klepner; Sameh W. Asaad; S. Basavaiah; Bob Havreluk; David F. Heidel; Michael Immediato; Keith A. Jenkins; Rajiv V. Joshi; et al. (VTS, 1998)

RF circuit design aspects of spiral inductors on silicon. - Joachim N. Burghartz; Daniel C. Edelstein; Mehmet Soyuer; Herschel A. Ainspan; Keith A. Jenkins (IEEE J. Solid State Circuits, 1998)

Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor. - Phillip J. Restle; Keith A. Jenkins; Alina Deutsch; Peter W. Cook (IEEE J. Solid State Circuits, 1998)

Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. - Keith A. Jenkins; James P. Eckhardt (IEEE Des. Test Comput., 2000)

A clock distribution network for microprocessors. - Phillip J. Restle; Timothy G. McNamara; David A. Webber; Peter J. Camporese; Kwok F. Eng; Keith A. Jenkins; David H. Allen; Michael J. Rohn; Michael P. Quaranta; David W. Boerstler; Charles J. Alpert; Craig A. Carter; et al. (IEEE J. Solid State Circuits, 2001)

Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits. - Jean-Olivier Plouchart; Noah Zamdmer; Jonghae Kim; Melanie Sherony; Yue Tan; Asit Ray; Mohamed Talbi; Lawrence F. Wagner; Kun Wu; Naftali E. Lustig; Shreesh Narasimha; Patricia O'Neil; et al. (IBM J. Res. Dev., 2003)

Delay chain based programmable jitter generator. - Tian Xia; Peilin Song; Keith A. Jenkins; Jien-Chung Lo (ETS, 2004)

CMOS IC diagnostics using the luminescence of OFF-state leakage currents. - Stas Polonsky; Keith A. Jenkins; Alan J. Weger; Shinho Cho (ITC, 2004)

An on-chip jitter measurement circuit with sub-picosecond resolution. - Keith A. Jenkins; Anup P. Jose; David F. Heidel (ESSCIRC, 2005)

On-Chip Spectrum Analyzer for Analog Built-In Self Test. - Anup P. Jose; Keith A. Jenkins; Scott K. Reynolds (VTS, 2005)

Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. - John U. Knickerbocker; Paul S. Andry; L. Paivikki Buchwalter; Alina Deutsch; Raymond R. Horton; Keith A. Jenkins; Young Hoon Kwark; Gerald McVicker; Chirag S. Patel; Robert J. Polastre; Christian D. Schuster; Arun Sharma; et al. (IBM J. Res. Dev., 2005)

On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks. - Keith A. Jenkins; Kenneth L. Shepard; Zheng Xu 003 (CICC, 2007)

Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure. - Saibal Mukhopadhyay; Keunwoo Kim; Keith A. Jenkins; Ching-Te Chuang; Kaushik Roy 001 (ISSCC, 2007)

A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement. - Rahul M. Rao; Keith A. Jenkins; Jae-Joon Kim (ISSCC, 2008)

An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process. - Saibal Mukhopadhyay; Keunwoo Kim; Keith A. Jenkins; Ching-Te Chuang; Kaushik Roy 001 (IEEE J. Solid State Circuits, 2008)

Experimental Analysis of Substrate Noise Effect on PLL Performance. - Woogeun Rhee; Keith A. Jenkins; John C. Liobe; Herschel A. Ainspan (IEEE Trans. Circuits Syst. II Express Briefs, 2008)

A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset. - Keith A. Jenkins; Lionel Li (VTS, 2009)

A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry. - Rahul M. Rao; Keith A. Jenkins; Jae-Joon Kim (IEEE J. Solid State Circuits, 2009)

A simple array-based test structure for the AC variability characterization of MOSFETs. - Karthik Balakrishnan; Keith A. Jenkins; Duane S. Boning (ISQED, 2011)

Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators. - Jente B. Kuang; Keith A. Jenkins; Kevin Stawiasz; Jeremy D. Schaub (ESSCIRC, 2013)

On-chip circuit for measuring multi-GHz clock signal waveforms. - Keith A. Jenkins; Phillip J. Restle; P. Z. Wang; D. Hogenmiller; David W. Boerstler; Thomas J. Bucelot (VTS, 2013)

On-chip circuit to monitor long-term NBTI and PBTI degradation. - Keith A. Jenkins; Pong-Fei Lu (Microelectron. Reliab., 2013)

5.3 Wide-frequency-range resonant clock with on-the-fly mode changing for the POWER8TM microprocessor. - Phillip J. Restle; David Shan; David Hogenmiller; Yong Kim; Alan J. Drake; Jason Hibbeler; Thomas J. Bucelot; Gregory S. Still; Keith A. Jenkins; Joshua Friedrich (ISSCC, 2014)

Long-term NBTI degradation under real-use conditions in IBM microprocessors. - Pong-Fei Lu; Keith A. Jenkins; Tobias Webel; Oliver Marquardt; Birgit Schubert (Microelectron. Reliab., 2014)

Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. - Pong-Fei Lu; Keith A. Jenkins; K. Paul Muller; Ralf Schaufler (IRPS, 2015)

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. - Franco Stellari; Keith A. Jenkins; Alan J. Weger; Barry P. Linder; Peilin Song (IRPS, 2015)

The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking. - Eric J. Fluhr; Steve Baumgartner; David W. Boerstler; John F. Bulzacchelli; Timothy Diemoz; Daniel Dreps; George English; Joshua Friedrich; Anne Gattiker; Tilman Gloekler; Christopher J. Gonzalez; Jason Hibbeler; et al. (IEEE J. Solid State Circuits, 2015)

A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. - Tony Tae-Hyoung Kim; Pong-Fei Lu; Keith A. Jenkins; Chris H. Kim (IEEE Trans. Very Large Scale Integr. Syst., 2015)

A statistical critical path monitor in 14nm CMOS. - Bruce M. Fleischer; Christos Vezyrtzis; Karthik Balakrishnan; Keith A. Jenkins (ICCD, 2016)

Electron mobility in thin In0.53Ga0.47As channel. - Eduard Cartier; Atreya Majumdar; K.-T. Lee; Takashi Ando; Martin M. Frank; John Rozen; Keith A. Jenkins; C. Liang; C.-W. Cheng; John Bruley; M. Hopstaken; Pranita Kerber; et al. (ESSDERC, 2017)

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. - Franco Stellari; Alan J. Weger; Keith A. Jenkins; Giuseppe La Rosa; Barry P. Linder; Peilin Song (IRPS, 2018)

Effect of HCI degradation on the variability of MOSFETS. - C. Zhou; Keith A. Jenkins; P. I. Chuang; Christos Vezyrtzis (IRPS, 2018)

Understanding and Measuring the Jitter Generated by Digital CMOS Gates. - Keith A. Jenkins (Circuits Syst. Signal Process., 2025)

How to Measure the Frequency Response of Nanoscale Transistors. - Keith A. Jenkins (IEEE Instrum. Meas. Mag., 2025)