Applications of Hierarchical Test. - Kelly Ockunzzi; Richard Grupp; Brion Keller; Mark Taylor; Sreekanth Pai; Greeshma Jayakumar (ITC, 2019)

On-chip MISR Compaction Technique to Reduce Diagnostic Effort and Test Time. - Jaidev Shenoy; Kelly Ockunzzi; Virendra Singh; Kushal Kamal (VLSID, 2019)