A general purpose 1149.4 IC with HF analog test capabilities. - Stephen K. Sunter; Ken Filliter; Joe Woo; Pat McHugh (ITC, 2001)

Using At-Speed BIST to Test LVDS Serializer/Deserializer Function. - Magnus Eckersand; Fredrik Franzon; Ken Filliter (J. Electron. Test., 2002)