BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. - Ken-ichi Yamaguchi; Hiroki Wada; Toshimitsu Masuzawa; Hideo Fujiwara (Asian Test Symposium, 2001)

Subspace identification for continuous-time stochastic systems via distribution-based approach. - Akira Ohsumi; Kentaro Kameyama; Ken-ichi Yamaguchi (Autom., 2002)

Power-Constrained DFT Algorithms for Non-Scan BIST-able RTL Data Paths. - Zhiqiang You; Ken-ichi Yamaguchi; Michiko Inoue; Jacob Savir; Hideo Fujiwara (Asian Test Symposium, 2004)

Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths. - Zhiqiang You; Ken-ichi Yamaguchi; Michiko Inoue; Jacob Savir; Hideo Fujiwara (IEICE Trans. Inf. Syst., 2005)

Constant-Space Population Protocols for Uniform Bipartition. - Hiroto Yasumi; Fukuhito Ooshita; Ken-ichi Yamaguchi; Michiko Inoue (OPODIS, 2017)

Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests. - Hiroshi Iwata; Nanami Katayama; Ken-ichi Yamaguchi (IEICE Trans. Inf. Syst., 2017)

Space-Optimal Population Protocols for Uniform Bipartition Under Global Fairness. - Hiroto Yasumi; Fukuhito Ooshita; Ken-ichi Yamaguchi; Michiko Inoue (IEICE Trans. Inf. Syst., 2019)

On the Use of ChatGPT for Code Review: Do Developers Like Reviews By ChatGPT? - Miku Watanabe; Yutaro Kashiwa; Bin Lin 008; Toshiki Hirao; Ken-ichi Yamaguchi; Hajimu Iida (EASE, 2024)

Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements. - Hiroshi Iwata; Kokoro Yamasaki; Ken-ichi Yamaguchi (J. Electron. Test., 2024)