A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. - Toshihiro Matsuda; Hiroaki Takeuchi; Akira Muramatsu; Hideyuki Iwata; Takashi Ohzone; Kyoji Yamashita; Norio Koike; Ken-ichiro Tatsuuma (IEICE Trans. Electron., 2005)