Physics Based Fault Models for Testing High-Voltage LDMOS. - Sukeshwar Kannan; Bruce C. Kim; Anurag Gupta; Friedrich Taenzler; Richard Antley; Ken Moushegian (VLSI Design, 2013)

Physics-Based Low-Cost Test Technique for High Voltage LDMOS. - Sukeshwar Kannan; Kaushal Kannan; Bruce C. Kim; Friedrich Taenzler; Richard Antley; Ken Moushegian; Kenneth M. Butler; Doug Mirizzi (J. Electron. Test., 2013)

A novel BIST technique for LDMOS drivers. - Bruce C. Kim; Saikat Mondal; Friedrich Taenzler; Kenneth Moushegian (MWSCAS, 2014)