Application of Test-View Modeling to Hierarchical ATPG. - Rahul Shukla; Phong Loi; Ken Pham; Arie Margulis; Kathy Yang; Nagesh Tamarapalli (VLSID, 2014)

A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. - Tassanee Payakapan; Senwen Kan; Ken Pham; Kathy Yang; Jean-Francois Cote; Martin Keim; Jennifer Dworak (ITC, 2015)