Yield and reliability of MNOS EEPROM products. - Yoshiaki Kamigaki; Shin-Ichi Minami; Takaaki Hagiwara; Kazunori Furusawa; Takeshi Furuno; Ken Uchida; Masaaki Terasawa; Koubu Yamazaki (IEEE J. Solid State Circuits, 1989)

Physical random number generator based on MOS structure after soft breakdown. - Shinichi Yasuda; Hideki Satake; Tetsufumi Tanamoto; Ryuji Ohba; Ken Uchida; Shinobu Fujita (IEEE J. Solid State Circuits, 2004)

Si Nanocrystal MOSFET with Silicon Nitride Tunnel Insulator for High-rate Random Number Generation. - Ryuji Ohba; Daisuke Matsushita; Koichi Muraoka; Shinichi Yasuda; Tetsufumi Tanamoto; Ken Uchida; Shinobu Fujita (ISVLSI, 2006)

Web-Based Intelligent CSCW Exploiting Context-Based Reasoning. - Yoshitaka Sakurai; Avelino J. Gonzalez; Johann Nguyen; Kouhei Takada; Ken Uchida; Setsuo Tsuruta (SITIS, 2008)

Single-electron devices for ubiquitous and secure computing applications. - Ken Uchida (DAC, 2009)

Nanoelectronics Research for Beyond CMOS Information Processing. - George Bourianoff; Michel Brillouët; Ralph K. Cavin III; Toshiro Hiramoto; James A. Hutchby; Adrian M. Ionescu; Ken Uchida (Proc. IEEE, 2010)

Regional, National, and International Nanoelectronics Research Programs: Topical Concentration and Gaps. - Michel Brillouët; George Bourianoff; Ralph K. Cavin III; Toshiro Hiramoto; James A. Hutchby; Adrian M. Ionescu; Ken Uchida (Proc. IEEE, 2010)

Using contexts to supervise a collaborative process. - Avelino J. Gonzalez; Setsuo Tsuruta; Yoshitaka Sakurai; Johann Nguyen; Kouhei Takada; Ken Uchida (Artif. Intell. Eng. Des. Anal. Manuf., 2011)

Delay Time Component of InGaAs MOSFET Caused by Dynamic Source Resistance. - Masayuki Yamada; Ken Uchida; Yasuyuki Miyamoto (IEICE Trans. Electron., 2014)

Thermal-aware CMOS: Challenges for future technology and design evolutions. - Ken Uchida; Tsunaki Takahashi (ESSDERC, 2016)

The Destiny-class CyberCANOE - a surround screen, stereoscopic, cyber-enabled collaboration analysis navigation and observation environment. - Noel Kawano; Ryan Theriot; Jack Lam; Eric Wu; Andrew Guagliardo; Dylan Kobayashi; Alberto Gonzalez; Ken Uchida; Jason Leigh (ERVR, 2017)

Low-Power and ppm-Level Detection of Gas Molecules by Integrated Metal Nanosheets. - Takahisa Tanaka; K. Tabuchi; Kohei Tatehora; Yohsuke Shiiki; S. Nakagawa; Tsunaki Takahashi; R. Shimizu; Hiroki Ishikuro; Tadahiro Kuroda; T. Yanagida; Ken Uchida (VLSI Circuits, 2019)

A Wide Range and High Accuracy Sensor Interface with Switching Regulator for Coin-Cell Powered Tiny Wireless Sensor Node. - Kohei Tatehora; Yohsuke Shiiki; S. Nakagawa; Takahisa Tanaka; Ken Uchida; Hiroki Ishikuro (ISCAS, 2020)

Enhanced Drain Current in Transient Mode due to Long Ionization Time of Shallow Impurities at 4 K in 65-nm bulk Cryo CMOS Transistors. - Tomohisa Miyao; Takahisa Tanaka; Itsuki Imanishi; Masayuki Ichikawa; Shuya Nakagawa; Hiroki Ishikuro; Toshitsugu Sakamoto; Munehiro Tada; Ken Uchida (DRC, 2022)

A Cryo-CMOS 10-bit 60-MS/s SAR ADC with common-mode variation suppression switching scheme and gain boosting dynamic comparator. - Chia-Wei Pai; Ken Uchida; Munehiro Tada; Hiroki Ishikuro (Microelectron. J., 2024)

Design and analysis of a high-speed low-power comparator with regeneration enhancement and through current suppression techniques from 4 K to 300 K in 65-nm Cryo-CMOS. - Chia-Wei Pai; Ken Uchida; Munehiro Tada; Hiroki Ishikuro (Microelectron. J., 2024)