Practical optical waveform probing of flip-chip CMOS devices. - Keneth R. Wilsher; William K. Lo (ITC, 1999)

Optical interferometric probing of advanced microprocessors. - Travis M. Eiles; Keneth R. Wilsher; William K. Lo; G. Xiao (ITC, 2000)

Practical, non-invasive optical probing for flip-chip devices. - G. Dajee; Norman Goldblatt; Ted R. Lundquist; Steven Kasapi; Keneth R. Wilsher (ITC, 2001)

Designed -in-diagnostics: A new optical method. - Keneth R. Wilsher (ITC, 2003)

An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits. - P. LeCoupanec; William K. Lo; Keneth R. Wilsher (Microelectron. Reliab., 2003)

Backside E-Beam Probing on Nano scale devices. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Christian Boit; Rajesh Jain; Tahir Malik; Keneth R. Wilsher; Ted R. Lundquist; Bernd Krüger (ITC, 2007)