Low-Contact-Force Probing on Copper Electrodes. - Kenichi Kataoka; Toshihiro Itoh; Katsuya Okumura; Tadatomo Suga (ITC, 2002)

Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers. - Kenichi Kataoka; Toshihiro Itoh; Tadatomo Suga (ITC, 2003)