A gate delay model focusing on current fluctuation over wide-range of process and environmental variability. - Kenichi Shinkai; Masanori Hashimoto; Atsushi Kurokawa; Takao Onoye (ICCAD, 2006)

Future Prediction of Self-Heating in Short Intra-Block Wires. - Kenichi Shinkai; Masanori Hashimoto; Takao Onoye (ISQED, 2007)

Clock skew reduction by self-compensating manufacturing variability with on-chip sensors. - Shinya Abe; Kenichi Shinkai; Masanori Hashimoto; Takao Onoye (ACM Great Lakes Symposium on VLSI, 2010)

Statistical Timing Analysis Considering Clock Jitter and Skew due to Power Supply Noise and Process Variation. - Takashi Enami; Shinyu Ninomiya; Kenichi Shinkai; Shinya Abe; Masanori Hashimoto (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010)

Prediction of Self-Heating in Short Intra-Block Wires. - Kenichi Shinkai; Masanori Hashimoto; Takao Onoye (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010)

Device-parameter estimation with on-chip variation sensors considering random variability. - Kenichi Shinkai; Masanori Hashimoto (ASP-DAC, 2011)

Extracting Device-Parameter Variations with RO-Based Sensors. - Kenichi Shinkai; Masanori Hashimoto; Takao Onoye (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2011)

Extracting device-parameter variations using a single sensitivity-configurable ring oscillator. - Yuma Higuchi; Kenichi Shinkai; Masanori Hashimoto; Rahul M. Rao; Sani R. Nassif (ETS, 2013)

A gate-delay model focusing on current fluctuation over wide range of process-voltage-temperature variations. - Kenichi Shinkai; Masanori Hashimoto; Takao Onoye (Integr., 2013)